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Chemicals, plastics and rubber industries

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Study of the polydispersity of grafted poly(dimethylsiloxane) surfaces using single-molecule atomic force microscopy

Article Abstract:

Atomic Force Microscopy has great scope to analyze contour lengths of polymers/macromolecules at surfaces. The values of persistence, lengths and other parameters obtained from filling the force-distance profiles indicate that the measurements typically involved stretching single PDMS molecules grafted to the underlying surfaces.

Author: Al-Maawali, Sabah, Bemis, Jason E., Akhremitchev, Boris B., Leecharoen, Rojana, Janesko, Benjamin G., Walker, Gilbert C.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
Polymers, Atomic force microscopy

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Molecule corrals as templates for the formation of metal and silicon nanostructures

Article Abstract:

Gold and silicon nanostructures are produced by condensing vacuum-evaporated materials onto nanometer-sized etch-pit templates performed on the surface of highly oriented pyrolytic graphite. Scanning tunneling spectroscopy is used to further investigate the electronic properties of multilayered silicon nanostructures.

Author: Janesko, Benjamin G., Walker, Gilbert C., McBride, Jennifer D., Tassell, Ben Van, Jachmann, Rabecca C., Beebe, Thomas P., Jr.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
All Other Basic Inorganic Chemical Manufacturing, Industrial inorganic chemicals, not elsewhere classified, Silicon, Gold Compounds, Tunneling spectroscopy

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Perturbations of the fully resolved eletronic spectra of large molecules by the internal rotation of attached methyl groups: influence of complex formation

Article Abstract:

The barrier to internal rotation of a methyl group attached to an unsaturated linkage in an organic molecule is changed by complex formation with a weakly bound argon atom. This is a result of a dispersion interaction between the argon and pie-electrons of the molecule in the vicinity of the methyl group.

Author: Janesko, Benjamin G., Walker, Gilbert C., Jachmann, Rabecca C., Beebe, Thomas P., Jr., Korter, Timothy M., Pratt, David W.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
Electric properties, Molecules, Methyl groups, Methyl group

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Subjects list: Research, Usage, Chemistry, Physical and theoretical, Physical chemistry, Atomic properties
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