Quality 1993 Chester Placek - Abstracts
| Quality 1993 Chester Placek | |||||
| Title | Subject | Authors | |||
|---|---|---|---|---|---|
| Digital probe could change electronic gaging. | Engineering and manufacturing industries | Chester Placek | |||
| DMIS application patent raises questions among CMM OEMs, software firms, and users. (dimensional measuring interface specification, Fanamation Inc., coordinate measuring machines, original equipment manufacturers) | Engineering and manufacturing industries | Chester Placek | |||
| US manufacturing executives grade themselves "C" on key quality areas. | Engineering and manufacturing industries | Chester Placek | |||
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