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Chemicals, plastics and rubber industries

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Abstracts » Chemicals, plastics and rubber industries

Structure of the interface between two polar liquids: Nitrobenzene and water

Article Abstract:

Synchrotron X-ray reflectivity is used to explore the electron density as a function of depth through the bulk nitrobenzene-water interface at four different temperatures. The measured interfacial width differs from the predictions of capillary wave theory with a progressively smaller deviation as the temperature is raised and computer simulations have suggested a presence of both molecular layering and dipole ordering parallel to the interface.

Author: Schlossman, Mark L., Benjamin, Ilan, Pingali, Sai Venkatesh, Malkova, Sarka, Schultz, David G., Binhua Lin, Meron, Mati, Vanysek, Petr
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
Cyclic crudes and intermediates, Cyclic Crude and Intermediate Manufacturing, Nitrobenzene, Water, Computer simulation, Computer-generated environments, Nitrobenzenes, Structure

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Photoemission studies of polythiophene and polyphenyl films produced via surfaces polymerization by ion-assisted deposition

Article Abstract:

A study is carried out on the conducting polymer films that are grown by mass-selected, hyperthermal thiophene ions coincident on a surface with a thermal beam of organic monomers of either alpha-terthiophene (3T) or p-terphenyl (3P) neutrals. The conducting polymer films formed by surface polymerization by ion-assisted deposition (SPIAD) displayed new valence band features.

Author: Hanley, Luke, Wallace, Daniel J., Wroble, Amanda T., Tepavcevic, Sanja, Choi, Yongsoo, Bissen, Mark
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
Science & research, Petroleum Refineries, Petroleum refining, Polymerization, Research, Electric properties, Photoemission, Optical properties, Thiophene

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Nanostructure of fluorocarbon films deposited on polystyrene from hyperthermal C3F5(super +) ions

Article Abstract:

The complete structural analysis of the fluorocarbon films by comparing the X-ray reflectivity data with the power spectral densities of the atomic force microscopy (AFM) data is presented. The deposition of the polyatomic fluorocarbon ions is explained with molecular dynamics simulations.

Author: Sinnott, Susan B., Schlossman, Mark L., Fuoco, Erick R., Wijesundara, Muthu B.J., Hanley, Luke, Ming Li, Akin, F. Ahu, Jang, Inkook, Zajac, Gerry, Tikhonov, Aleksey, Wroble, Amanda T., Pingali, Sai Venkatesh
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
Crystals, Crystal structure, Atomic force microscopy, Spectral energy distribution

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Subjects list: Usage, Chemical properties, Analysis
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