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Chemicals, plastics and rubber industries

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Temperature-programmed desorption and reflectance absorption infrared spectroscopy of H2O:HBr thin films of varying stoichiometry from <1:1 to 5:1

Article Abstract:

Issues concerning the varying stoichiometry from <1:1 to 5:1 of thin films of H2O:HBr by using reflection absorbance infrared spectroscopy and temperature-programmed desorption are presented.

Author: Carlo, S. R., Grassian, V. H.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
Usage, Reflectance spectroscopy, Stoichiometry

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Experimental and theoretical demonstration of the interfacial interaction potential between an adsorbed film and a smooth substrate

Article Abstract:

Issues concerning the study of the rate of sublimation of a solid organic film on smooth surfaces by use of atomic force microscopy techniques are reported.

Author: Mu, R., Ueda, A., Wu, M. H., Tung, Y. S., Henderson, D. O, Chamberlain, R. T., Curby, W., Mercado, A.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
Surface chemistry, Chemical microscopy, Sublimation

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Scaling laws in the fragmentation of disordered layers

Article Abstract:

An investigation into the scaling properties of fragments of thin films under external forces is described. The study focuses on thin layers on supports.

Author: Handge, Ulrich A., Sokolov, Igor M., Blumen, Alexander
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
Scaling laws (Statistical physics), Scaling laws (Mathematical physics)

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Subjects list: Research, Thin films, Chemistry, Physical and theoretical, Physical chemistry
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