Abstracts - faqs.org

Abstracts

Chemicals, plastics and rubber industries

Search abstracts:
Abstracts » Chemicals, plastics and rubber industries

The role of excited Rydberg states in electron transfer dissociation

Article Abstract:

Ab initio electronic structure methods are used to estimate the cross sections for electron transfer from donor anions having electron binding energies ranging from 0.001 to 0.6 eV to each of three sites in a model disulfide-linked molecular cation. It is found that the attachment to the ground Rydberg orbital has a higher cross-section than attachment either to the orbital or to certain excited Rydberg orbitals that cleavage of the S-S bond is likely to occur.

Author: Simons, Jack, Sobczyk, Monika
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
Electron transport, Chemical reactions, Anions

User Contributions:

Comment about this article or add new information about this topic:

CAPTCHA


Damage to model DNA fragments by 0.25-1.0 eV electrons attached to a thyamine pi* orbital

Article Abstract:

A study was conducted to examine a range of electron kinetic energies (E), and determine how the rates of cleavage of the sugar-phosphate C-O sigma-bond depend on E and on the solvation environment. The results reveals that electrons of ca. 1.0 eV could attach to form a pi*-anion, which then could break either a 3' or 5' O-C sigma-bond connecting the phosphate to either of two attached sugar groups.

Author: Skurski, Piotr, Simons, Jack, Berdys, Joanna
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
Biological Product (except Diagnostic) Manufacturing, Drugs, Deoxyribonucleic Acid, DNA, Chemical reaction, Rate of, Chemical kinetics, Solvation, Scission (Chemistry)

User Contributions:

Comment about this article or add new information about this topic:

CAPTCHA


Model calculations relevant to disulfide bond cleavage via electron capture influenced by positively charged groups

Article Abstract:

Ab initio electronic calculations are used to study the effects of nonneighboring positively charged groups on the ability of low-energy (<1 eV) electrons to directly attach to S-S standard deviation bonds in disulfides to effect bond cleavage. A mechanism for bond rupture that may be operative in electron capture dissociation (ECD) experiments is proposed.

Author: Hudgins, Robert R., Sawicka, Agnieszka, Skurski, Piotr, Simons, Jack
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2003
Electric properties, Electrons, Dissociation, Dissociation reactions, Electron capture

User Contributions:

Comment about this article or add new information about this topic:

CAPTCHA


Subjects list: Research, Chemical bonds
Similar abstracts:
  • Abstracts: The determination of bronsted acid sites in zeolite ERS-7 by neutron and X-ray powder diffraction. MAS NMR studies on the dealumination of zeolite MCM-22
  • Abstracts: Effect of spatially distributed hydrophobic surface residues on protein-polymer association. Significant effects of magnetic and gravitational fields on the morphology of protein crystals (orthorhombic lysozyme crystals grown using NiCl2 as crystallization agents)
  • Abstracts: Effect of spatially distributed hydrophobic surface residues on protein-polymer association. part 2 Structure and thermodynamics of protein-polymer solutions: Effects of spatially distributed hydrophobic surface residues
  • Abstracts: Theory of excitation energy transfer in the intermediate coupling case of clusters
  • Abstracts: Electronic polarization reversal and excited state intramolecular charge transfer in donor/acceptor ethynylpyrenes
This website is not affiliated with document authors or copyright owners. This page is provided for informational purposes only. Unintentional errors are possible.
Some parts © 2025 Advameg, Inc.