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Chemicals, plastics and rubber industries

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Transport rates vary with deposition time in dip-pen nanolithography

Article Abstract:

Results from extended time measurements of the two most common ink-substrate combinations used in dip-pen nanolithography (DPN), 16-mercaptohexadeconoic acid (MHDA) and 1-octadecanethiol (ODT) on Au surfaces, using are presented. Studies indicate that measurements with short dwell times are insufficient to determine transport rates for larger features.

Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005

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Kinetics of atomic force microscope-based scanned probe oxidation on an octadecylated silicon(111) surface

Article Abstract:

Atomic force microscope-based scanned probe oxidation (SPO) nanolithography is carried out on an octadecyl-terminated Si(111) surface to create dot-array patterns under ambient conditions in contact mode. The kinetics investigation indicates that this SPO involves three stages.

Author: Menglong Yang, Zhikun Zheng, Yaqing Liu, Bailin Zhang
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
Silicon & Inorganic Compounds, Optical properties, Silicon compounds, Structure

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Surfactant aggregates at rough solid-liquid interfaces

Article Abstract:

An improved atomic force microscopic imaging of surfactant surface aggregates on rough gold surfaces which display substantially different morphologies compared to atomically smooth materials is reported.

Author: Aksay, Ilhan A., Schniepp, Hannes C., Saville, Dudley A., Ho C. Shum
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2007
Analysis, Solid-liquid equilibrium

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Subjects list: Research, Usage, Atomic force microscopy, Gold compounds, Atomic properties, Nanolithography
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