Use of molecular vibrations to analyze very thin films with infrared ellipsometry

Article Abstract:

The nylon-6 and polystyrene as prototypical materials with organic groups are used to demonstrate that for silicon or gold substrates, features due to the molecular vibrations can be seen in the ellipsometric spectra for thin films with signal to noise ratios ranging from 2 to 10. For all the substrates, infrared (IR) ellipsometry provides molecular structure information.

Semiconductors and related devices, Semiconductor and Related Device Manufacturing, Thin Film Materials, Gold, Silicon, Thin films, Optical properties, Dielectric films

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Semiconductor flatband potential determination by electromodulated infrared spectroscopy

Article Abstract:

The investigators have proposed a method for the direct determination of U(sub fb) using infrared spectroscopy to probe the free charge carrier concentration at the surface. Results confirmed that electrical and infrared measurements yield equivalent results in systems where both techniques can be used.

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Analysis of the absorption and emission spectra of U(super 3+) in CsCdBr(sub 3) single crystal

Article Abstract:

The Laser selective excitation and emission spectroscopic investigations indicate the presence of one major and two minor U(super 3+) sites in U(super 3+):CsCdBr3 single crystals. Visible anti-stokes emission is observed for U(super 3+) ions in site A due to the excited-state absorption (ESA) mechanism.

Cadmium, Cesium, Analysis, Spectra, Excited state chemistry, Bromides, Bromides (Chemistry)

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