Electrochemical applications of 'in situ' scanning probe microscopy

Article Abstract:

This study focuses on the advancement made through 'in situ' electrochemical scanning tunneling microscopy (STM) and atomic force microscopy (AFM) imaging for better understanding of the processes at the solid/liquid interface. This process is collectively known as scanning probe microscopy (SPM). The study shows results of 'in situ' investigations conducted on structure of bare metal surfaces, monolayers and multilayers of metals formed on top of its surface, semiconductors and adsorbates.

Electrochemical apparatus, Electrochemical instruments

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Cross-sectional scanning tunneling microscopy

Article Abstract:

The use of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) has become very important in fundamental studies of surfaces, and problems of technological interest. Cross-sectional STM's performance is based on the ability to obtain cross-sectional surfaces that are uncontaminated, atomically flat, and electronically unpinned. Thus, it is proven that cross-sectional STM can be applied to nanometer-scale science and technology.

Imaging systems, Image quality

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Scratching the surface: fundamental investigations of tribology with atomic force microscopy

Article Abstract:

The tunneling current is measured using a scanning tunneling microscope (STM). However, using atomic force microscope (AFM) measures the force between a sample surface and a small tip seen in the image. This study focuses on investigations regarding friction, adhesion and others from a macroscopic and a convenient point of view, collectively known as tribology. In nanotribology, AFM is the effective tool to be used.

Tribology

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