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Computer-aided design for VLSI circuit manufacturability

Article Abstract:

The goals of computer-aided design (CAD) for manufacturability as applied to very-large-scale integration (VLSI) circuit design are to optimize the design along with its manufacturing process in a recursive manner to maximize product yield. Manufacturability of a chip, particularly in terms of product yield, can have a large impact on manufacturing profit. The chip development cycle typically consists of four major stages: planning, design, prototyping and manufacturing. Each of these stages is discussed. Two classes of uncertainty that affect manufacturability are modeling inefficiencies and process disturbances. Specific problems include global disturbances, process design mis-centering, design over sensitivity and process-design mismatches. CAD tools to optimize IC manufacturability should provide process simulation, circuit simulation and yield and performance predictors.

Author: Maly, Wojciech
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1990
Circuit design, Manufacturing, Computer aided design, Product life cycle, Performance improvement (Computers), Optimization, Computer-Aided Design, Performance Improvement, technical

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Automating the VLSI design process using expert systems and silicon compilation

Article Abstract:

The automation of VLSI design is necessary to avoid costly design iterations. Systems are needed that automate the design process, or silicon compilation, beginning with the highest level system specification, and resulting in the actual masks, boards, and system configurations. Several completed projects and current research are discussed. Algorithmic and knowledge-based methods of higher level synthesis, such as area estimation and module binding concurrent with synthesis, are described.

Author: Parker, Alice C., Hayati, Sally
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1987
Expert systems, Automation, Compiler/decompiler

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Subjects list: Very large scale integration, Very-Large-Scale Integration
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