Performance-directed synthesis of VLSI systems

Article Abstract:

The performance-directed synthesis of very-large-scale integration (VLSI) chips to meet behavioral, layout area, performance and other requirements requires synthesis algorithms that work both in and between the several layers of representation. The rapidly increasing complexity and performance of VLSI circuit technologies are requiring computer-aided design tools that meet these multiple constraints while quickly generating circuit designs in a cost-effective manner. Layers of representation to be addressed by the VLSI design process include the functional/behavioral specification, architectural specification, design of circuits to realize logical functions, layout specifications, and mask specifications. Correspondingly, algorithms must implement, optimize and relate behavioral-level, register-transfer-level, logic-level, circuit-level and layout-level synthesis processes.

Circuit design, Computer aided design, Logic circuits, Simulation, Computer-Aided Design, Requirements Analysis, Logic Circuitry, Performance Specifications, Integrated Approach, technical

---

Fault tolerant VLSI systems

Article Abstract:

Fault tolerance techniques are usually not suitable for on-chip very-large-scale (VLSI) design. Yield presents a problem because a chip performing triplication and voting on the single die has very minimal yield. Fault tolerance in VLSI circuits deals with replication of lower components and augmentation of higher level components. Several fault tolerance measures have been suggested for VLSI circuitry such as coding, which is being employed for commercial products. The newer techniques have yet to be commercially accepted. Enough data are available on logic and information redundancy but development opportunities in the area of on-chip, system-level fault tolerance remain numerous. Manufacturers are still hesitant to have fault tolerance in general-purpose VLSI processors but advances in reliable and relatively high-yielding technology can change this attitude.

Semiconductors and related devices, Integrated circuits, Reliability (Trustworthiness), Reliability, Fault Tolerance, Fault tolerant computer systems

---

Similar abstracts:

• Abstracts: The high-level synthesis of digital systems. Design for reliability: the major challenge for VLSI

This website is not affiliated with document authors or copyright owners. This page is provided for informational purposes only. Unintentional errors are possible.