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Design tools: applications '90

Article Abstract:

Events and trends during 1989 in circuit design tools focused on incremental refinements in a variety of design technologies, a growing emphasis on design for testability, increased use of simulation accelerators and progress in circuit design systems standards development. Logic synthesis gained general acceptance, as the technology can now synthesize sequential portions of a circuit description and behavioral-level synthesis capabilities come closer. Design for testability methodologies, such as boundary scan and built-in self-test, are of continuing interest, with synthesis for testability looming in the future. Improvements in the design of analog circuitry are being pursued, though most firms concentrate on analog systems design. Several computer-aided design standards have either become accepted or are under continuing development.

Author: Murphy, Erin E.
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1990
Electronic computers, Instruments to measure electricity, Analytical instruments, Standard, Standardization, Business conditions, Products, Trends, Simulation, Self-Test Capability, Review of Past Year, Logic Analyzer, Logic analyzers

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Computer-aided R&D: chips are at the cutting edge

Article Abstract:

Computer-aided design and computer-aided engineering (CAD-CAE) tools are used more often by corporations that want to speed product life cycles. CAD-CAE was first used extensively by the semiconductor industry. Design tools became necessary as device complexity grew; the design of a one-million-device processor, for instance, necessitates use of modern CAE tools. CAD tools are used to automate routine tasks and to simulate ICs at a high level. In a few years it is expected that designers will have tools to help them mix analog and digital logic on the same chip. Future testing strategies may be dominated by design for testability. Built-in self test is another strategy that design tools may eventually support.

Author: Murphy, Erin E.
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1990
Technological forecasting, Industrial research, Computer aided engineering, Research and Development, Future of Computing, Simulation Theory, Validation, Computer-Aided Engineering

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Subjects list: Circuit design, Computer aided design, Computer-Aided Design
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