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Engineering and manufacturing industries

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EDIF grows up

Article Abstract:

Electronic Design Interchange Format (EDIF) is a standard data format developed by a consortium of electronic design automation vendors and semiconductor vendors. EDIF translators convert data from a given design tool into EDIF as a standard format, and from EDIF into whatever form is needed by another design tool. Electronics companies welcome EDIF because when engineers move from one step in the design process to another step, they often find tools incompatible. The first version of EDIF, released in May 1984, has undergone several revisions. The American National Standards Institute accepted EDIF as an industry standard in 1988. The present version, EDIF 2.0, was published by the Electronic Industries Association in May 1987. Thirty-three EDIF translators and other software tools are listed in this directory. Information includes product name, manufacturer, price, platform, operating system, translator type, source and general comments.

Author: Eurich, John P., Roth, Gene
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1990
Prepackaged software, Standard, Standardization, Electronic design automation, Circuit design, Computer aided design, Computer aided engineering, Directories, File format conversion software, buyers guide, Software Packages, Computer-Aided Design, Computer-Aided Engineering

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Expert opinion: instruments bring users more information than ever

Article Abstract:

Improved displays and increased computational abilities, due to digital signal processing (DSP), are making test and measurement equipment much more flexible and powerful. However, their greater complexity makes built-in self-testing highly desirable. The increased DSP capabilities are enabling the design of modular instrumentation that offer more and new test and measurement functions and rapidly perform more meaningful measurements. The increasing instrument sophistication is requiring improved displays with multiple lines, flexible menus and more meaningful content. New digital architectures such as the VXIbus are easing the integration of multiple digital instruments. Built-in self-testing becomes important to ensure the functionality and accuracy of the digital test and measurement equipment and to isolate possible problems.

Author: Hume, Frederick R.
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1992
Instruments to measure electricity, Digital signal processors, Systems development, Intelligent machines, Signal processing, System Development, Integrated Systems, Trends, User Interface, User interfaces (Computers), Displays, Self-Test Capability, Test Equipment, Intelligent Devices, Digital Signal Processor

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