SPOT offers measurement answers

Article Abstract:

The Sampling Pattern Optimization Technologies (SPOT) approach has been developed by researchers from the University of San Francisco, with the aid of quality engineers at Sandia National Laboratories, Livermore, CA, and AlliedSignal Inc., Federal Manufacturing & Technologies, Kansas City, MO. SPOT is used to identify sampling locations where probing features can yield the most information, thus providing fewer sample points for a given amount of accuracy. This will greatly reduce errors from traditional manual patterns and works well with existing coordinate-measuring machines.

Instrument industry, Product development

---

ISO working group tackles tolerancing

Article Abstract:

The International Organization for Standardization's (ISO) technical committee working group (TC 213) in Geneva are seeking alternative measures that would guarantee the consistency of tolerance statistics. The group is considering the implementation of various design/manufacturing and inspection standards in order to match measurements obtained from the CAD file with those garnered from coordinate-measuring machines. The research group further plans to address issues relating to measurement uncertainty and conformance/non conformance with specifications.

Research, International Organization for Standardization, Tolerance (Engineering)

---

Scanning-probe system measures fragile parts

Article Abstract:

The Faith Tool and Die firm of Owensboro, KY, which makes mask-forming tools for cathode-ray-tube makers, employed a coordinate-measuring machine (CMM) from L.S. Starrett Co of Athol, MA to address its problems in measure their products without outsourcing the service. Benefits of using the new CMM include reduced risks from damaged parts in transit, a shortened 2-hour measuring time, and better error discovery and correction.

Electron Tube Manufacturing, Electron tubes, CRT Tubes, Production management, Product information, Electronics industry, Control equipment industry, Cathode ray tubes, Faith Tool and Die, L.S. Starrett Co., SCX

Similar abstracts:

• Abstracts: Test and measurement. Logic comes to the rescue. Microelectronic ghost story
• Abstracts: Software. Sizing up online particle size analysis. Reaping the benefits of roundtable discussions
• Abstracts: Your customers are talking, but are you listening? How to handle references
• Abstracts: Transparent transistors. Commercializing quantum keys
• Abstracts: Recent research. Benchmarking goes to school. Merging quality cultures in contract manufacturing

This website is not affiliated with document authors or copyright owners. This page is provided for informational purposes only. Unintentional errors are possible.