X-ray inspection moves into process control: x-ray inspection joins machine vision as a factory-friendly technology

Article Abstract:

Advances in fiber-optic technology have made high-resolution real-time x-ray inspection possible for use in manufacturing process control. Use of a scintillating fiber-optic screen allows efficient high-resolution conversion of x-rays to visible light. The use of a micro-focus x-ray point source and the attendant distortion is also obviated. Portable x-ray cameras using this technology make process control applications a true competitor for machine vision for a wide variety of uses including welding applications such as turbine blades and pressure vessels as well as solder joints.

Equipment and supplies, X-rays

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Improving the process: x-ray inspection finds defects

Article Abstract:

Digital wireless telephone maker Siemens Wireless Terminals of Austin, TX, used an in-line x-ray inspection application that produced high electrical-test yields. The x-ray inspection system, developed by Hewlett-Packard of Palo Alto, CA, has helped improved Siemens' manufacturing process by accurately identifying defects on the printed-circuit boards it produces. Real-time and design-related process improvements were made using the data from the SMT (surface-mount technology) monitoring system, x-ray inspection system, SMT placement equipment and the bill-of-material system.

Radio & TV communications equipment, Radio and Television Broadcasting and Wireless Communications Equipment Manufacturing, Cellular Mobile Tel Equip, Production management, Wireless telephones, Cellular telephone equipment industry, Siemens Wireless Terminals

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Surface texture measurement errors - stylus type instruments

Article Abstract:

Manufacturing processes often necessitate accurate surface measurement to create excellent products or make production more economical. However, manufacturers often resort to the most convenient or most economical methods when determining surface roughness, without considering possible sources of error that may influence readings. Errors may be caused by techniques, instrumentation, instrument settings, factors relating to equipment and the environment.

Measurement, Cover Story, Measuring instruments, Surface roughness

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