The 2/3 power law dependence of capillary force on normal load in nanoscopic friction
Article Abstract:
During the sliding of an atomic force microscope (AFM) tip on the hydrophilic rough surface, water capillary bridges can form between the tip and the asperities of the surface. The total capillary force due to these bridges increases with the normal load following a 2/3 power law and an analytical relationship is derived to explain the interplay between humidity, velocity, and normal load in nanoscopic friction.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
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Hierarchical structure of TPPS4 J-aggregates on substrate revealed by atomic force microscopy
Article Abstract:
The spatial structure of the J-aggregates of meso-tetra (4-sulfonatophenyl) porphine (TPPS4) formed in aqueous solutions and coated on silicon substrates is analyzed in the light of atomic force microscopy (AFM). The study shows that TPPS4 equilibrium aggregates formed in aqueous solutions preserve a stable structure on the substrate and can be used for further optoelectronic applications.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
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Conducting probe atomic force microscopy investigation of anisotropic charge transport in solution cast PBD single crystals induced by an external field
Article Abstract:
Solution cast 2-(4-Biphenylyl)-5-(4-tert-butylphenyl)-1,3,4-oxadiazole (PBD) single crystals with different crystallographic axes perpendicular to the Au/S substrates in large area are achieved by controlling the rate of solvent evaporation in the presence and absence of external electrostatic field respectively.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
User Contributions:
Comment about this article or add new information about this topic:
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