X-ray reflectivity study of the water-hexane interface

Article Abstract:

The electron density profile of the bulk water-hexane interface has been studied with a novel synchrotron x-ray reflectivity method that is used in flattening the liquid-liquid interface. A Barnstead NanoPure system is used in producing high-purity water while measurements were taken from samples that were first stirred with a Teflon-coated stir bar. The samples attained thermal equilibrium in a vapor-tight sample cell. Results are given in terms of an error function electron density profile and revealed that the interfacial width has a value of 0.33 (+/- 0.025) nm.

Analysis, Surface chemistry, Electronic structure, Atomic structure, Electron configuration, Phase rule and equilibrium, Phase equilibrium, Water analysis

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X-ray reflectivity and interfacial tension study of the structure and phase behavior of the interface between water and mixed surfactant solutions of CH3(CH2)19OH and CF3(CF2)7(CH2)2OH in hexane

Article Abstract:

The interface between water and mixed surfactant solutions of CH3(CH2)19OH and CF3(CF2)7(CH2)2OH in hexane is studied with interfacial tension and X-ray reflectivity measurements. A simple model is presented that predicts the basic features of the domain coverage for the mixed surfactant system from the behavior of the single surfactant systems.

Industrial Organic Chemicals, Cyclic Crude and Intermediate Manufacturing, Hexane, Surface tension, Carbon compounds

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An X-ray reflectivity study of the water-docosane interface

Article Abstract:

The synchrotron X-ray reflectivity is used to study the electron density profile normal to the interface between bulk water and bulk n-docosane (C22H46). The absence of interfacial freezing observed for n-alkanes of a similar chain length at the alkane-vapor and alkane-silicon oxide interfaces is discussed.

Usage, Chemistry, Physical and theoretical, Physical chemistry, Alkanes, Reflectance

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