X-ray reflectivity study of the water-hexane interface
Article Abstract:
The electron density profile of the bulk water-hexane interface has been studied with a novel synchrotron x-ray reflectivity method that is used in flattening the liquid-liquid interface. A Barnstead NanoPure system is used in producing high-purity water while measurements were taken from samples that were first stirred with a Teflon-coated stir bar. The samples attained thermal equilibrium in a vapor-tight sample cell. Results are given in terms of an error function electron density profile and revealed that the interfacial width has a value of 0.33 (+/- 0.025) nm.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 1999
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X-ray reflectivity and interfacial tension study of the structure and phase behavior of the interface between water and mixed surfactant solutions of CH3(CH2)19OH and CF3(CF2)7(CH2)2OH in hexane
Article Abstract:
The interface between water and mixed surfactant solutions of CH3(CH2)19OH and CF3(CF2)7(CH2)2OH in hexane is studied with interfacial tension and X-ray reflectivity measurements. A simple model is presented that predicts the basic features of the domain coverage for the mixed surfactant system from the behavior of the single surfactant systems.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
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An X-ray reflectivity study of the water-docosane interface
Article Abstract:
The synchrotron X-ray reflectivity is used to study the electron density profile normal to the interface between bulk water and bulk n-docosane (C22H46). The absence of interfacial freezing observed for n-alkanes of a similar chain length at the alkane-vapor and alkane-silicon oxide interfaces is discussed.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
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