Challenges to manufacturing submicron, ultra-large scale integrated circuits
Article Abstract:
The cost of manufacturing submicron, ultra-large-scale integration (ULSI) integrated circuits (ICs) is scaling upwards at least in inverse proportion to the downwards scaling of device feature sizes. These costs are driven by a parameter budget crisis associated with the technological and complexity limits of IC design and fabrication. This budget crisis is defined for technologies associated with patterning, mechanical control, thermal treatments, particulates and contamination, defects, electrical parameters and manufacturing. Competition on the production floor has put manufacturing in the role of a technology driver for setting R&D priorities for silicon ULSI. In this paper these priorities are identified and quantified, and the potential impact of some new research results is discussed. It is pointed out that the R&D agenda to deal with the ULSI manufacturing budget crisis is enormous, and the semiconductor industry cannot perform all of it. Since the time for transferring new developments into production tools and technologies is five to seven years, critical funding decisions need to be made now for ULSI manufacturing science breakthroughs by the turn of the century. (Reprinted by permission of the publisher.)
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1990
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Some tools for analyzing chaos
Article Abstract:
Two bifurcation theorems, developed by Soviet mathematicians Melnikov and Shilnikov, may by used to describe complex, unpredictable "chaotic" motion. These theorems, which have been applied in many fields, deal with homoclinic orbits - trajectories which contain the unstable and stable dynamics of generalized saddle points. Homoclinic orbits may often have recurrent behavior nearby. These orbits are related to Smale's horseshoe map, which is unstable, and thus to shifts which operate on symbol sequences. The two theorems are local and do not give a complete picture of a particular system, however, they give more information than simulation would on its own.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1987
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