Design of integrated circuits: directions and challenges
Article Abstract:
Computer-aided engineering (CAE) technologies will increasingly address the entire integrated circuit (IC) cycle. Forces that will make CAE IC design highly automated by the year 2000 are the demand for a reduced IC product design cycle, increasing integration and complexity of semiconductor designs, and competitive pressures for lower IC manufacturing costs and increased manufacturability and quality. An assessment of the state of current IC CAE reviews CAE frameworks, CAE tools, design process management, data management and design databases, user interfaces, inter-tool communications and modeling and libraries. CAE research that may lead to shorter design cycles is addressing improved design synthesis, design for reliability, design for manufacturability, design for test, design frameworks and methodologies, improved package design, and analog and mixed analog/digital devices.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1990
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Superconductor-semiconductor hybrid devices, circuits, and systems
Article Abstract:
The combination of high-temperature superconductors and semiconductors is facilitating hybrid circuitry that can perform certain electronic functions better than either technology separately, though further, novel applications are being explored. The advent of high-temperature (critical temperature above that of liquid nitrogen) superconductors has prompted the research into hybrid applications. These include the development of superconducting interconnections in digital semiconductor systems, hybrid computing systems with superconducting logic circuits implemented with niobium Josephson junctions, hybrid millimeter-wave receiver systems, semiconductor-superconductor circuits, analog signal processing and superconductors used as gates in high-frequency field-effect transistors. Details of the potential applications are described.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1989
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