Memory LSI reliability
Article Abstract:
Reliability in large-scale integration (LSI) memory has become critical amidst scaling down of device size and increasing memory capacity. The key physical mechanisms for failures in memory LSI reliability are hot carrier, electro/stress migration and alpha-particle-induced failures. These failures are categorized into initial or short-term, long-term and soft failures. Countermeasures based on improvements in devices and processes, however, are available to improve reliability. Fault tolerance techniques are also valuable in achieving high reliability. The techniques are spare row/column line substitution technique and on-chip error-correcting code technique. Better reliability without compromising LSI performance degradation calls for a comprehensive assessment of failure mechanisms. Future memory LSIs also require the establishment of a total design methodology.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1993
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Assuring quality and reliability of complex electronic systems: hardware and software
Article Abstract:
Interest is growing in ways to control and assure quality and reliability in complex electronic systems. With increasingly sensitive measurements made by such systems, continuous fault-free operation is a primary concern. Recent trends in the expansion of quality assurance methods over all phases of design, development, manufacture, and use of both hardware and software. Product life-cycle QA includes: establishing requirements; assuring parts reliability; evaluation of fault-tolerant architectures; avoidance of physical design hazards; measurement of manufacturing requirements conformity; and field-performance tracking.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1988
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Radionavigation System Integrity and Reliability
Article Abstract:
Integrity and reliability performance of radionavigation systems are examined. Alternative radionavigation systems are postulated from the integrity and reliability of present systems. NAVSTAR GPS is specifically evaluated.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1983
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