VLSI reliability in Europe
Article Abstract:
Several European organizations promote the advancement of very-large-scale integration reliability through information exchange such as conferences or through research programs such as ESPRIT which is a cooperative research organization. A Technical Interest Group within the ESPRIT is specifically tasked with initiatives related to integrated circuit reliability. All European countries also have their own national learning societies. Two of the research projects devoted primarily to reliability are the PLASIC (Performance and reliability of plastic encapsulated CMOS ASIC) and the EPST (ESD Protection for Submicron Technologies) projects. The future of reliability engineering is gearing toward technologies such as smaller feature sizes on the chip, which suggests higher reliability risk, and larger chips, which entail higher reliability hazards caused by mechanical stresses.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1993
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VLSI reliability challenges: from device physics to wafer scale systems
Article Abstract:
The Japanese integrated circuit industry exhibits philosophical and practical variations regarding very-large-scale integration (VLSI) reliability as compared to that of its US counterpart. Japanese consumers are more likely to demand for better quality than US consumers. The Japanese approach to quality control management emphasizes a common pursuit of quality improvement among employees while the US mainly relies on effective quality guidelines. Japanese designers and engineers are also more cooperative while their US counterparts tend to be more independent. A more comprehensive understanding of processes such as hot-carrier effects, dielectrics and metallization is necessary to promote the building-in reliability approach to VLSI. Innovative VLSI testing and yield-enhancing redundancy techniques are also required to attain high reliability.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1993
User Contributions:
Comment about this article or add new information about this topic:
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