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European technology policy and R&D consortia: the case of semiconductors

Article Abstract:

Europe's technology policy, which aims to promote co-operation in research and development (R&D), continues to create setbacks in the semiconductor industry. Despite improving Europe's technological competency, the region's technological policy failed to stimulate technological research in producing results that can be easily transformed into marketable products. Such condition emphasizes the inefficiency of R&D programs to help firms that have poor technology and unstable market positions.

Author: Lucchini, Nathalie
Publisher: Inderscience Publishers Ltd.
Publication Name: International Journal of Technology Management
Subject: Science and technology
ISSN: 0267-5730
Year: 1998
Semiconductor Devices, Research & Development, Scientific Research and Development Services, Science, Space & Technology, Semiconductor industry, Europe, Laws, regulations and rules, Industrial research, Research institutes, Science and technology policy

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A technometric assessment of sensor technology in Israel vs Europe, the USA and Japan

Article Abstract:

Technometry was employed to assess the performance of sensors across different classes, physical characteristics and countries to make a comparison between the Israeli sensor industry and its counterparts in the US, Europe and Japan. The resulting technometric profile showed that small players such as Israel can produce 'high-performing competitive' sensors along side major manufacturers such as Germany, Japan and the US.

Author: Maital, Shlomo, Grupp, Hariolf, Koschatzky, Knut, Frenkel, Anon
Publisher: Inderscience Publishers Ltd.
Publication Name: International Journal of Technology Management
Subject: Science and technology
ISSN: 0267-5730
Year: 1996
Case studies, Evaluation, Technological innovations, Sensors, Technology assessment

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Measuring dynamic technical change: a technometric approach

Article Abstract:

Research into the use of technometrics, a microeconomic approach to the benchmarking of technical adjustments to products, is presented, with focus on the development of a measurements that can be displayed on graphs.

Author: Frenkel, Amnon, Maital, Shlomo, Grupp, Hariolf
Publisher: Inderscience Publishers Ltd.
Publication Name: International Journal of Technology Management
Subject: Science and technology
ISSN: 0267-5730
Year: 2000
Silicon Chip Pressure Sensors, Research, Performance, Usage, Measurement, Microeconomics, Benchmarks, Benchmarking, Silicon pressure sensors

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