A theoretical investigation of the yield-to-damage enhancement with polyatomic projectiles in organic SIMS

Article Abstract:

It is observed that polyatomic projectiles have the potential to improve the sensitivity of organic secondary ion mass spectrometry by increasing the yield without a comparable increase in damage to the sample. Molecular dynamics simulations of the high energy bombardment of an organic film are performed with the purpose of understanding how the yield-to-damage ratio is enhanced with polyatomic projectiles.

Bombardment

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Kiloelectronvolt argon-induced molecular desorption from a bulk polystyrene solid

Article Abstract:

The particle-induced desorption of polystyrene (PS) tetramers from a molecular solid sample is studied using molecular dynamics simulations. A PS monolayer on silver and a thick (45 angstrom) PS sample is bombarded by 0.5-ke V Ar projectiles, at a polar angle of 45 degree Celcius, to identify the specifics of bulk organic sample sputtering.

Plastics Material and Resin Manufacturing, Plastics materials and resins, Polystyrene, Laboratory Apparatus and Furniture Manufacturing, Styrene Resins, Polystyrene Resins NEC, Laboratory apparatus and furniture, Evaporation & Sputtering Eqp, Chemical properties, Sputtering (Physics), Sputtering (Irradiation)

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Surface analysis studies of yield enhancements in secondary ion mass spectrometry by polyatomic projectiles

Article Abstract:

Secondary ion mass spectrometry is the most used mass spectrometric technique for the surface analysis of molecular solids composed of organic, polymeric and biomolecular species. By increasing the projectile ion mass and kinetic energy, the secondary ion yields increase due to improved momentum transfer to the surface.

Ions, Chemistry, Physical and theoretical, Physical chemistry, Atomic properties

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