Controlled production of molecule corrals using cesium ion bombardment: a TOF-SIMS, XPS, and STM study

Article Abstract:

Combined surface analysis techniques of time-of-flight secondary ion mass spectrometry (TOF-SIMS), X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) were employed for studying the surface chemistry of highly oriented pyrolytic graphite (HOPG) that is bombarded with energetic cesium (Cs(super +)) ions. The experimental findings suggest that the cesium implanted in HOPG exists in an oxidized state rather than in a metallic state and Cs(super +) ion bombardment was responsible for the surface modification of HOPG, which resulted in controlled defect production and enhanced oxygen adsorption.

Primary Smelting and Refining of Nonferrous Metal (except Copper and Aluminum), Industrial inorganic chemicals, not elsewhere classified, Cesium, X-ray spectroscopy, Scanning tunneling microscopy, Surface chemistry, Chemical properties, Atomic properties

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Dynamics of metastable nanoscale island growth and dissolution at electrochemical interfaces by time-resolved scanning tunneling microscopy

Article Abstract:

Potential pulse perturbation time-resolved scanning tunneling microscopy is used to investigate the growth and dissolution dynamics of nanoscale islands. It is concluded that the properties of the islands can be controlled by tailoring the potential pulse perturbation.

Molecular dynamics, Electrochemistry, Tunneling spectroscopy

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