Abstracts - faqs.org

Abstracts

Chemicals, plastics and rubber industries

Search abstracts:
Abstracts » Chemicals, plastics and rubber industries

Effect of processing conditions on the formation of aggregates and phase domains in monolayers of the hemicyanine dye, 4-(4-(dihexadecylamino)styryl)-N-methylpyridinium iodide

Article Abstract:

Epifluorescence microscopy and tapping mode AFM measurements is used to study the morphology of Langmuir-Blodgett monolayers of the hemicyanine dye, 4-(4-dihexadecylamino)styryl)-N-methylpyridinium iodide under varying conditions spreading, concentration, compression, speed, aging subphase composition and deposition pressure. Results showed that morphology is very sensitive to film preparation conditions and is also relatively insensitive to deposition pressure for a given film preparation protocol.

Author: Lusk, Amy L., Bohn, Paul W.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
Fluorescence microscopy, Thin films, Multilayered, Multilayered thin films

User Contributions:

Comment about this article or add new information about this topic:

CAPTCHA


Boundary lubrication and surface mobility of mixed akylsilane self-assembled monolayers

Article Abstract:

A combination of experiment and theory is used to study the boundary lubrication characteristics of mixed self-assembled monolayers (SAMs) formed by tethering alkylsilanes with different chain lengths to planar substrates. Systematic increase in surface disorder is indicated as the molecular weight of molecules is lowered in one-component systems and, in mixed SAMs, as the difference in molecular weight of the two-component sis varied and as the ratio of the components approaches 1/1.

Author: Zhang, Qing, Archer, Lynden A.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2003
Observations, Infrared spectroscopy

User Contributions:

Comment about this article or add new information about this topic:

CAPTCHA


Spectroscopic characterization of 4'-substituted aromatic self-assembled monolayers on GaAs(100) surface

Article Abstract:

High-resolution X-ray photoelectron spectroscopy and near-edge X-ray adsorption fine structure spectroscopy were used to characterize GaAs(100) engineered by self-assembled monolayers (SAMs) of 4'-substituted aromatic molecules. The covalent coupling of 1,1'-bipenyl-4-thiol derivatives enabled both the protection of GaAs surface from degradation and control over surface free energy of the engineered GaAs.

Author: Grunze, M., Tanaka, M., Zharnikov, M., Shaporenko, A., Aldkofer, K., Johansson, L. S. O., Ulman, A.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
Gallium arsenide

User Contributions:

Comment about this article or add new information about this topic:

CAPTCHA


Subjects list: Analysis, Spectra, Monomolecular films
Similar abstracts:
  • Abstracts: Spectral properties, formation of dye molecular aggregates, and reactions in Rhoda mine 6G/layered silicate dispersions
  • Abstracts: Effect of micelle composition on the formation of surfactant-templated polymer films. Scattering curves of ordered mesoscopic materials
  • Abstracts: Infrared spectroscopic study of the formation of reactive silica by pyrolysis in vacuo of a trimethylsiloxylated sample
  • Abstracts: Use of solid insertion probe mass spectrometry and constant rate thermal analysis in the study of materials: determination of apparent activation energies and mechanisms of solid-state decomposition reactions
  • Abstracts: Reduction of iron oxide catalysts: The investigation of kinetic parameters using rate perturbation and linear heating thermoanalytical techniques
This website is not affiliated with document authors or copyright owners. This page is provided for informational purposes only. Unintentional errors are possible.
Some parts © 2025 Advameg, Inc.