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Electron transport through rectifying self-assembled monolayer diodes on silicon: Fermi-level pinning at the molecule-metal interface

Article Abstract:

A strong metal-induced Fermi-level pinning that completely controls the electrical behavior of the molecular rectifying diodes is reported. The results have shown that Fermi-level pinning at the [pi] group/metal interface is responsible for the absence of a dependence of the rectification effect on the nature of the [pi] groups, even though the groups examined are selected to have significant variations in their electronic molecular orbitals.

Author: Rondelez, F., Palacin, S., Lenfant, S., Guerin, D., Van, F. Tran, Chevrot, C., Bourgoin, J.P., Bouloussa, O., Vuillaume, D.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
Electron transport, Atomic properties, Fermi surfaces

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New route for stabilizing silicon fullerenes

Article Abstract:

The structural models of silica-coated silicon fullerenes, which arise from a structurally stable building block [Si.sub.3][O.sub.2], are presented. The density functional theory calculations have indicated that coating silica on silicon clusters would be a new way for stabilizing silicon fullerenes, which might be employed in nanotechnology.

Author: Dongju Zhang, Chengbu Liu, Guanlun Guo
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
Nanotechnology, Fullerenes

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Subjects list: Research, Silicon, Chemical properties
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