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Chemicals, plastics and rubber industries

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Abstracts » Chemicals, plastics and rubber industries

Self-association of rifamycin B: possible effects of molecular recognition

Article Abstract:

The macrocyclic antibiotic rifamycin B was observed to be very surface-active and to aggregate in aqueous solution. The aggregational behavior was investigated through small-angle neutron scattering. Aqueous solutions of rifamycin B revealed pronounced scattering at both small-length scales and at large-length scales. Findings indicated that the self-aggregation of rifamycin B may be a factor that regulates its ability to differentiate between enantiomers in aqueous and hydro-organic solutions.

Author: Armstrong, Daniel W., Schneiderheinze, Jeffrey, Nair, Usha, Magid, Linda J., Butler, Paul D.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 1999
Research, Antibiotics

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A vapor pressure equation for an organic aerosol at ultra-low pressure

Article Abstract:

An equation was derived for the vapor pressure of an organic aerosol at ultra-low pressure conditions. The parameters included in the equation are the latent heat of evaporation, the curvature and the disjoining pressure effects. Through the equation, it is shown that the droplets curvature and disjoining pressure reduce the equilibrium vapor pressure. Results obtained by using the equation agree with previous experimental data.

Author: Kuz, Victor A.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 1999
Models, Measurement, Aerosols, Vapor pressure

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Quantitative molecular depth profiling of organic delta-layers by [C.sub.60] ion sputtering and SIMS

Article Abstract:

An organic delta-layered sample is constructed from Irganox1010 and Irganox3114 and is used for showing that the sputtering yield is a well behaved function of the [C.sub.60] ion energy and dose. The comparison of the secondary ion mass spectrometry (SIMS) response function with atomic force microscopy (AFM) data has shown that the depth resolution is dominated by the development of roughness.

Author: Shard, Alexander G., Green, Felicia M., Brewer, Paul J., Seah, Martin P., Gilmore, Ian S.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2008
Laboratory Apparatus and Furniture Manufacturing, Laboratory apparatus and furniture, Evaporation & Sputtering Eqp, Analysis, Observations, Antioxidants, Antioxidants (Nutrients), Spectra, Optical properties, Atomic force microscopy, Structure, Sputtering (Physics), Sputtering (Irradiation), Secondary ion mass spectrometry

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