The formation of fluorinated tetraphenylporphyrin nanoparticles via rapid expansion processes: RESS vs RESOLV

Article Abstract:

Organic nanoparticles of a fluorinated tetraphenylporphyrin (TBTPP) were produced by rapid expansion of supercritical CO2 solutions into both air (RESS) and an aqueous receiving solution containing a stabilizing agent (RESOLV). The fact that nanoparticles are produced from RESS of TBTPP, in contrast with other organics for which microparticles are produced can be explained in terms of the high melting point of TBTPP which results in a solid-state diffusion coefficient of TBTPP low enough so that particle coalescence is significantly reduced in the free jet.

Collisions (Nuclear physics), Particle collisions, Scanning electron microscopes

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Giant multiporphyrin arrays as artificial light-harvesting antennas

Article Abstract:

The structure and photophysical properties of the giant multiporphyrin arrays including meso, meso linked porphyrins, multiporphyrin dendrimers, and mutiporphyrin modified metal nanoclusters is studied. The result reveals that light harvesting systems provide valuable information on the design of porphyrin molecular assemblies that can be tailored to construct molecular photonic devices as well as artificial photosynthesis systems.

Photosynthesis research, Photochemistry

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Morphological and spectroscopic propertied of thin films of self-assembling amphiphilic porphyrins on a hydrophilic surface as revealed by scanning near-field optical microscopy

Article Abstract:

Porphyrin thin films are fabricated on mica surfaces from acidic aqueous solutions of the preorganized H-aggregates of amphiphilic porphyrins by the simple spin-coating method. The results demonstrate that the preorganized structure in solution can be transferred as a thin film with a thickness of the monolayer level without losing their substantial structure and photophysical properties.

Semiconductors and related devices, Semiconductor and Related Device Manufacturing, Thin Film Materials, Thin films, Dielectric films, Atomic force microscopy

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