Vapor adsorption in thin silicalite-1 films studied by spectroscopic ellipsometry

Article Abstract:

The effects of adsorption on thin silicalite-1 (super 17) films were studied using spectroscopic ellipsometry. Average film thicknesses of 84 and 223 nm for films processed for 10h and 30h were obtained through analysis of spectra using an optical model. Vapor adsorption from a nitrogen carrier gas was checked by ellipsometry and the amounts of vapor concentrations were measured depending on the refractive index when adsorbates replaced nitrogen in the pores.

Thin films, Optical properties, Silicon oxide films

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Low-temperature CO adsorption on AG+/SiO2 and Ag-ZSM-5: an FTIR study

Article Abstract:

Research was conducted to examine the adsorption of CO on both Ag-ZSM-5 and Ag+SiO2 samples using infrared spectroscopy at low and ambient temperature. 12CO-13CO isotopic mixtures were also investigated to obtain a better interpretation of the resulting spectra. Results reveal a drastic effect of the support on the properties of deposited silver cations. Findings confirm the high electron deficiency of various cations exchanged in ZSM-5 zeolites.

Analysis, Zeolites, Silver, Silicon compounds, Cryochemistry, Carbonyl compounds, Low temperature chemistry

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