Protocol failures in cryptosystems

Article Abstract:

A cryptosystem functions within the framework of a protocol that specifies data handling procedures to ensure the security or authentication required by the system. Unfortunately, poorly designed or implemented protocols can compromise the cryptoalgorithm used to secure the data. Protocol types that have been compromised include notary, common modulus, low entropy, low exponent, and single key protocols. The three classes of protocol failures are: oversight of a principle applicable to a broad range of cryptoalgorithms, a weakness in the algorithm as applied to the protocol, and designer overstatement of the amount of security the protocol could provide. A two-step approach to verifying the security of a protocol consists of: identifying all assumptions in the protocol, and determining the effect on the security of the protocol if each assumption is violated.

Encryption, Data encryption, Systems analysis, Data security, Communications protocols, Performance improvement (Computers), Cryptography, Protocol, System Design, Performance Improvement, Code Breaking, Public Key Cryptosystems

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Ill-posed problems in early vision

Article Abstract:

The process of extracting 3-D surface properties from 2-D images generated from the original 3-D images is a general inverse optical problem in early vision, the first computational stage in computer vision, which is often ill-posed. An ill-posed early vision problem is one wherein the 2-D image contains limited information about the 3-D properties, often leading to non-unique solutions. Mathematical algorithms are described that enable the generation of generalized well-posed, well-condition solutions from ill-posed, linear, inverse data. These algorithms are applied to such problems as edge detection, computation of optical flow, surface reconstruction, shape from shading, and stereo matching. Details and equations of the inverse optical problem solutions are described.

Computer vision, Industrial research, Algorithms, Problem solving, Image processing, Algorithm, Computer graphics, Three dimensional graphics, Research and Development, Applications, Three-Dimensional Graphics, Machine Vision, Two-Dimensional Graphics, Methods

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Facing the Headaches of Early Failures: A State-of-the Art Review of Burn-In Decisions

Article Abstract:

Burn-in testing of electronic equipment during manufacturing allows replacement of defective items by screening. Using simple calculations, it is determined that the number of failures decreases with burn-in time, so that only a few hours of burn-in are needed. Burn-in screening as applied to industrial products studies is reviewed. Case studies and mathematical models of the process are presented.

Mathematical models, Burn-in testing, Review, Performance, Case Study

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