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Instrumentation: applications '90

Article Abstract:

Major 1989 events and trends in electronic instrumentation include a continuing push for a design-for-testability standard, international agreement on volt and ohm measurement standards, and advancements in microwave and millimeter-wave integrated circuits (MIMICs) and MIMIC standards. IEEE voters approved a proposed design-for-testability standard, IEEE 1149.1, in a letter ballot in Aug 1989. The standard, which will receive a final vote by mid-1990, defines hardware and software specifications for testing chips and boards at the system level. The US and other countries have agreed to adjust their standards for volt and ohm measurement to conform to a common international standard. The NIST Consortium for Mimic Metrology was formed to develop standards for MIMIC devices. Gallium-arsenide MIMIC development is being pushed by the US Department of Defense.

Author: Fitzgerald, Karen
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1990
Instruments to measure electricity, Professional organizations, Future Technologies, Measurement Techniques, Cooperative Agreements, Microwave Communication, Electrical Parameter Testing

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Instrumentation

Article Abstract:

Standards for instruments-on-cards, versatile plug-in printed-circuit boards used to create customized test stations, are being considered by an IEEE committee. IEEE has accepted standards for embedding test capability in chips and PC boards, where critical circuit nodes are often made inaccessible by crowding gates and components. Sensors have been getting smarter with microprocessor-based electronics for years, and now interest is growing in low-cost sensors which can be etched into silicon, as well as fiber-optic sensors which can withstand extreme environments. High-temperature ceramic superconductors are providing sensitive magnetometers, voltmeters, amplifiers, and motion detectors for sensor applications.

Author: Fitzgerald, Karen
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1989
Tests, Testing

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Instrumentation

Article Abstract:

Hypres engineers introduced the worlds fastest and most sensitive digital oscilloscope, the PS-1000, using helium cooled, superconducting circuitry. In another development, the trend to instruments-on-cards that plug into PCs had a boost with five major companies supporting a standard bus for such instruments, called the VXI. For the engineer bored with oscilloscopes, H-P has provided the 5371A frequency and time-interval analyzer. In another area, chip makers are now emphasizing testability and even self-test in their designs, because of the cost of testing. Also, several new chip test systems are being offered.

Author: Fitzgerald, Karen
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1988
Measurement, Test Equipment, Oscilloscope

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Subjects list: Integrated circuits, Standard, Standardization, Circuit design, Instruments
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