Viewpoint: dealing with yield losses in IDDQ testing

Article Abstract:

The electronics test and measurement industry should invest in systematic research programs to improve the reliability of the quiescent-current (IDDQ) testing methodology. One particular issue that should be addressed in such programs is the yield loss that characterizes the use of the IDDQ principle. This factor has adverse effects on the profitability of electronic component manufacturers.

Instrument industry, Research, Instrument industry (Equipment), Electronic components, Testing and measuring equipment industry, Testing, Circuit components

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Viewpoint: methodology, not tools, is the key to winning the design race

Article Abstract:

Electronic design automation engineers should not rely solely on software tools to create sophisticated electronic systems. Instead, they should develop methodologies that will integrate the beneficial features of existing tools to create an innovative design concept that will allow reduced functional error, significant savings on product development costs and increased design reuse.

Methods, Evaluation, Electronic design automation, Computer-aided design, Computer aided design

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