Studies of tetracene- and pentacene-based organic thin-film transistors fabricated by the neutral cluster beam deposition method

Article Abstract:

The neutral cluster beam deposition method was applied to produce and characterize organic thin-film transistors based upon tetracene and pentacene molecules as active layers. The overall device characteristics are strongly correlated to the surface morphology and structures are strongly correlated to the surface morphology and structures of the organic thin films.

Author: Jong-Ho Choi, Abthagir, P. Syed, Young-Geun Ha, Eun-Ah You, Seon-Hwa Jeong, Hoon-Seok Seo
Semiconductors and related devices, Semiconductor and Related Device Manufacturing, Transistors, Design and construction, Electric properties, Organic semiconductors, Thin film devices, Neutral beams

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Experimental and theoretical investigation of the electronic structure of 5-fluorouracil compounds

Article Abstract:

A study compares experimental and theoretical X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES) of 5-fluorouracil compounds, with an emphasis on the effects of the inclusion of nickel in the structure. Results show that the nickel in the compound is coordinated with the nitrogen sites of the 5-fluorouacil ligands.

Author: Lee, J.S., Moewes, A., Wilks, R.G., MacNaughton, J.B.
Optical properties, Fluorouracil, Structure

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Probing interfacial characteristics of rubrene/pentacene and pentacene/rubrene bilayers with soft X-ray spectroscopy

Article Abstract:

The electronic structure of rubrene/pentacene and pentacene/rubrene bilayers was investigated by different spectroscopic methods and DFT calculations. The results revealed that the electronic structure of the pentacene-rubrene interface has a strong dependence on interface characteristics which in turn depend on the layering order used.

Author: Whang, C.N., Moewes, A., Seo, J.H., Pedersen, T.M., Chang, G.S., Yoo, K.H., Cho, S.J.
Lipid membranes, Electron configuration, Chemical properties, Atomic properties

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Subjects list: Usage, Analysis, X-ray spectroscopy
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