Future CMOS scaling and reliability
Article Abstract:
The two goals of metal oxide semiconductor field effect transistor (MOSFET) scaling are higher transistor current for speed and smaller size for density while MOSFET's two sets of constraints are acceptable leakage current and acceptable reliability lifetime and failure rate. The pursuit of these objectives are fueled by industry competition, demand and the quest for better technology. MOSFET has the capability to respond accordingly to the historical trend of density and speed up to the 0.09 micrometer technology, provided that there is enough support from lithography, etching, interconnect and manufacturing technologies. Built-in reliability based on failure prevention and prediction should be chosen over reliability assurance based on failure detection and testing. Circuit reliability simulation is an indispensable tool for attaining built-in reliability.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1993
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Superconductive analog signal processing devices
Article Abstract:
Superconductive analog signal-processing devices have been developed capable of performing the real-time signal processing required by such new technologies as pulse-compression radar, spread-spectrum communications, and sundry electronic warfare applications. The execution of such signal-processing operations as Fourier spectral analysis, matched filtering and correlation in a real-time system may require as many as 10(superscript 12) arithmetic operations per second and bandwidths exceeding 2 GHz. Superconductive analog signal-processing circuit elements include superconducting transmission lines, tapped delay lines, convolvers, correlators, resonators and several bandwidth-reducing circuits. The design, functioning and integration of the circuits and comparison with other technologies are described.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1989
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