# On the basic principles of radar polarimetry: the target characteristic polarization state theory of Kennaugh, Huynen's polarization fork concept, and its extension to the partially polarized case

Article Abstract:

Several different approaches to determining radar polarimetry optimal polarization states are compared for degree of resolution and efficiency. Optimal polarization state theory has applications in managing partially dual polarization radar reception problems in addition to the traditional problems. Huynen's polarization fork, which is an extension of the equally correct polarization state concept introduced by Kennaugh, serves as the basis for the work presented in this paper. Each of the above methods is valid in the coherent case, but there are no complete optimization procedures that determine optimum polarization states in the partially coherent case. But in the case of partial polarization, there are five pairs of characteristic polarization states. The Huynen fork concept is unique as a fundamental polarimetric radar inverse problem.

Publication Name: Proceedings of the IEEE

Subject: Electronics

ISSN: 0018-9219

Year: 1991

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# An asymptotically superior algorithm for computing the characteristic polynomial of a tridiagonal matrix

Article Abstract:

An efficient new algorithm, based on a divide-and-conquer technique, is developed for the computation of the characteristic polynomial of a tridiagonal matrix (TM). Such matrices occur in varied engineering and mathematics problems. The new methodology first transforms the three-term recurrence relation into a matrix-vector product form, to which the divide-and-conquer strategy is applied. Resulting polynomial products are computed with fast Fourier transform algorithms. The algorithm is found to be computationally more efficient than the classical algorithm for the problem.

Publication Name: Proceedings of the IEEE

Subject: Electronics

ISSN: 0018-9219

Year: 1988

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# A Partitioned Polynomial Integration Algorithm for Failure Probability Evaluation

Article Abstract:

All devices and componets are subjected to stress. The stress on the devices is random. Components have random capability to withstand the stress. An analytical technique to evaluate the probability of failure of a component is described. A graph shows failure probability evaluation.

Publication Name: Proceedings of the IEEE

Subject: Electronics

ISSN: 0018-9219

Year: 1984

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