Aluminum-based metallization enhances device reliability
Article Abstract:
Motorola Semiconductor Products Sector of Phoenix, AZ, has developed an aluminum-alloy top-metal transistor design that is capable of delivering median times to failure (MTTF) levels of over 100 years at 200 degrees Celsius. The system, designed for third-generation and fourth-generation two-GHz laterally diffused metal-oxide-semiconductor transistors, has been tested at the Sandia National Laboratories in Albuquerque, NM. Motorola's new aluminum top-metal design is capable of outperforming conventional one-layer metal gold designs.
Comment:
Has developed an aluminum-alloy top-metal transistor design capable of MTTF levels of over 100 years at 200 deg Celsius
Publication Name: Microwaves & RF
Subject: Engineering and manufacturing industries
ISSN: 0745-2993
Year: 1998
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Replace DSPs with FPGAs and CPLDs
Article Abstract:
Xilinx Inc of San Jose, CA, provides application information on the implementatio of digital-signal-processing functions at its website at www.xilinx.com. The Web site offers information on how to use field- programmable gateways and complex-programmable logic devices in different applications such as consumer electronics, telecommunications, industrial control, military and aerospace systems.
Publication Name: Microwaves & RF
Subject: Engineering and manufacturing industries
ISSN: 0745-2993
Year: 1998
User Contributions:
Comment about this article or add new information about this topic:
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