Test system inspects high-speed interface
Article Abstract:
Hewlett-Packard's digital IC test system provided valuable use in aiding Rambus Inc develop an interface technology with more than 500 MHz capability. By allowing users to evaluate all standard device parameters and detect logic and analog errors within a system, the test system became instrumental in ensuring the proper timing specifications of manufactured products. Aside from increasing Rambus' test capacity from 400 to 1320 MHz, the system also provided significant means of lowering the company's product rejection rate for customers.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1997
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Hone your contact-resistance measurements
Article Abstract:
The electrical reliability of connectors can be determined by measuring their contact resistance. In testing for contact resistance, it is advisable to use the four-terminal measurement technique to negate the effect of lead resistance. In addition, voltage probes should be positioned properly to avoid mechanical disturbances. It is also important to calculate for extraneous electromagnetic fields generated by temperature differences between the two metals.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1995
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Resistance test system
Article Abstract:
EMCA-Remex Products quality control department's test system for measuring the resistance and temperature coefficient of resistance of thick film resistor pastes has become outmoded. This prompted the firm to use a more powerful automated test and measurement system which features a digital multimeter and switching hardware. The new system facilitated faster testing and maximized the use of manpower, leading to better throughput, productivity and accuracy.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1993
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