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Chemicals, plastics and rubber industries

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Preparation of titanium-silicon binary oxide thin film photocatalysts by an ionized cluster beam deposition method. Their photocatalytic activity and photoinduced super-hydrophilicity

Article Abstract:

The Ti-Si binary oxide thin films having different TiO2 contents are prepared by applying an ionized cluster beam (ICB) deposition method using multi-ion sources as a dry process. The results of UV-vis absorption measurements, the transmittance of these binary oxide thin films with low Ti content is found to be much higher than that of the pure TiO2 thin film, indicating that the Ti-oxide species in the Ti-Si binary oxide thin films are highly dispersed within the SiO2 matrixes.

Author: Anpo, Masakazu, Takeuchi, Masato, Dohshi, Satoru, Eura, Takashi
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2003
Semiconductors and related devices, Semiconductor and Related Device Manufacturing, Thin Film Materials, Thin films, Dielectric films

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Formation of Molecular templates containing cumulative double bonds (C=C=C) at organic/silicon hybrid interfaces

Article Abstract:

The cumulative double bond (C=C=C), an important intermediate in synthetic organic chemistry, was successfully prepared via the selective attachment of acetylethyne to Si(111)-7 X 7. The cumulative double bonds C=C=C may be considered as a precursor for further dry organic syntheses ad modification of silicon surfaces.

Author: Guo Qin Xu, Hai Gou Huang, Jing Yan Huang, Yong Ping Zhang, Yue Sheng Ning, Kian Soon Yong
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
Organic compounds, Chemistry, Organic, Organic chemistry, Chemical bonds, Organic compound synthesis

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Comment on "Quantitative analysis of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides by the linear combination of XANES"

Article Abstract:

A quantitative analysis of Ti K-edge XANES spectra is used to obtain information about the Ti environment in Ti-Si binary oxides, including acid-catalyzed xerogels with molar ratios Ti/Si of 0.01 to 0.50. The results clarify a number of points concerning Ti environments in these xerogels.

Author: Smith, M.E., Mountjoy, G., Pickup, D.M., Newport, R.J.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
Quantitative chemical analysis

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Subjects list: Research, Silicon, Titanium, Chemical properties, Electric properties
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