Reactive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio

Article Abstract:

A new method to extract complex refractive indices of films with biaxial symmetry from polarized transmission and reflection spectra is described. Theoretical analysis demonstrates that the reflectance/transmittance ratio of two films of different thickness but with the same optical anisotropy is a simple function of the refractive index and extinction coefficient.

Anisotropy, Reflectance spectroscopy

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Refractive index mysteries of water

Article Abstract:

The differences in terms of a two-state bonding model are explained for water. A simple two-parameter formulation based on this model is found capable of describing the refractive index of water, including its thermal maximum near 0 degrees Celsius, from slightly supercooled temperatures to about +45 degrees Celsius within a four- to five-decimal place accuracy.

Water, Chemical bonds, Properties

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Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range

Article Abstract:

A technique is formulated to determine both thickness and refractive indices of free-standing films with biaxial symmetry from polarized transmission spectra. The films must be transparent and are found to show little dispersion in refractive indices in the wavelength range where the transmission spectra are collected.

Semiconductors and related devices, Semiconductor and Related Device Manufacturing, Thick Film Materials, Optical properties, Thick films

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