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Direct optimization of self-modeling curve resolution: application to the kinetics of the permanganate-oxalic acid reaction

Article Abstract:

A new procedure to derive concentration and spectrum information for unknown components in a mixture spectra series has been developed. The algorithm is a type of self-modeling curve resolution (SMCR) and does not require assumptions about data mixture other than those for linear additivity, non-negativity of concentrations and non-negativity of component spectra. The method gives permissible bands for spectra and concentration profiles of individual components in the mixtures. SMCR has been used for autocatalytic oxidation of oxalic acid by permanganate where sulfuric acid is present. Two reaction intermediates formerly proposed were verified using the method and their spectrum properties were confirmed.

Author: Wentzell, Peter D., Wang, Ji-Hong, Loucks, Leon F., Miller, Kelli M.
Publisher: NRC Research Press
Publication Name: Canadian Journal of Chemistry
Subject: Chemistry
ISSN: 0008-4042
Year: 1998
Methods, Measurement, Mathematical models, Spectrum analysis, Spectroscopy, Chemical reaction, Rate of, Chemical kinetics, Mathematical optimization, Optimization theory, Curves, Curves (Geometry), Oxalic acid

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Formation and reactivity of an aniline surface quantum dot

Article Abstract:

Formation and reactivity of an aniline-surface quantum dot have been studied as part of a study of surface functionalization of cadmium sulfide quantum-confined nanoclusters. Preparation, characterization, reactivity and other properties of a novel quantum-confined CdS nanocluster with a chemically active aniline surface are described. Three general methods are given for covalent attachment under mild conditions of a wide range of molecular moieties to the cluster surface.

Author: Veinot, Jonathan G.C., Galloro, Josie, Pugliese, Linda, Bell, Valerie, Pestrin, Robert, Pietro, William J.
Publisher: NRC Research Press
Publication Name: Canadian Journal of Chemistry
Subject: Chemistry
ISSN: 0008-4042
Year: 1998
Nanotechnology, Materials science, Semiconductors

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SIMS studies of the effect of H at interfaces formed by oxidized zirconium

Article Abstract:

Secondary ion mass spectrometry (SIMS) studies of the effect of H at interfaces formed by oxidized zirconium have been investigated. SIMS was used for guidance in searching for an oxidation procedure that produces a thin, relatively sharp oxide layer on macroscopic zirconium. A new preparation that depends on dip-coating in hydrogen peroxide solution is a suitable one.

Author: Mitchell, K.A.R., Shimizu, K., Wong, P.C., Flinn, B.J.
Publisher: NRC Research Press
Publication Name: Canadian Journal of Chemistry
Subject: Chemistry
ISSN: 0008-4042
Year: 1998
Metals, Metals (Materials), Nuclear reactors, Hydrogen, Zirconium oxide, Properties, Secondary ion mass spectrometry

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Subjects list: Usage, Canada, Observations, Research
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