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A conceptual framework for ASIC design

Article Abstract:

A conceptual framework for the design of application-specific integrated circuits (ASICs) is developed. The driving force for development of the framework includes the need to more rapidly transfer complex ASIC technology to other engineering disciplines. ASIC development is driven by the needs for improved performance and reliability, lower cost, faster design turnaround, and better design security. The framework involves three major components: the design process, emphasizing a hierarchical design approach; the design hyperspace, involving design space, algorithm space, and architecture space alternatives; and the design repertoire, including techniques for analysis of algorithm and architecture alternatives. The DOEMA (design object, design engine, system manager, and expert assistant) model of ASIC design is a unified conceptual model of the design process.

Author: Leung, Steven S., Fisher, P. David, Shanblatt, Michael A.
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1988
Systems analysis, Computer aided engineering, Cost benefit analysis, System Design, Methods, Structured Design Techniques, technical, Computer-Aided Engineering

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ASIC reliability and qualification: a user's perspective

Article Abstract:

The IBM facility at Rochester, MN, is using a supplier application-specific integrated circuit (ASIC) technology to add to the silicon and package technology offered within the company. Vendor component reliability, however, should be suitable with IBM's internal technology to achieve system reliability objectives. Validation of assumptions regarding the reliability of an ASIC technology follows a three-level approach. These levels are base technology evaluation, functional ASIC evaluation and the field. The IBM Rochester ASIC qualification process requires suppliers to substantiate their capacity to do the theoretical technology work. The process approximates that which is employed for other semiconductor components except for key variations such as supplier selection process, test techniques and the focus on base technology qualification data.

Author: Harry, Cletus C., Mathiowetz, Curtis H.
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1993
Technology, Reliability (Trustworthiness), Reliability

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CAD tools for ASIC design

Article Abstract:

The growing complexity of electronic systems precipitated by the use of Very Large Scale Integration (VLSI) has necessitated the utilization of advanced computer aided design (CAD) tools. CAD will also be instrumental in the design of the application-specific IC (ASIC). IC CAD systems of the future must incorporate several vital technologies. Tools for IC synthesis, such as placement and routing, combinational and sequential logic synthesis tools, design system management tools, and verification tools are discussed.

Author: Newton, Arthur R., Sangiovanni-Vincentelli, Alberto L.
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Publication Name: Proceedings of the IEEE
Subject: Electronics
ISSN: 0018-9219
Year: 1987
Computer aided design, Very large scale integration, Computer-Aided Design, Semiconductor Preparation, Very-Large-Scale Integration

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Subjects list: Application specific integrated circuits, Application-Specific Integrated Circuit
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