Programs help spot hot spots

Article Abstract:

The rate of failure of electronic components increases with the temperature. Time-dependent dielectronic breakdown (TDDB),- also known as oxide wearout - has been rated among the three leading causes of VLSI failure. Thermal factors are often neglected during the system development stage. Computer-aided design software highlights areas where cooling may be inadequate, allowing engineers to fix the problem during the design phase. Because such failures are costly, the Air Force, Army and Navy programs require higher thermal qualifications and reliability than ever before. These specifications are discussed.

Circuit design, Reliability (Trustworthiness), Computer aided software engineering, Very large scale integration, Reliability, Failure, Very-Large-Scale Integration, Computer-Aided Software Engineering

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Education: New Programs

Article Abstract:

On January 23, 1984, WNET begins an Academy on Computers in the United States that runs for twelve weeks and attempts to demystify computers for viewers. Graduate-engineering courses are offered through the Network Northeastern University's live telecasts to companies in Massachusetts. A technology-update video conference will be offered on February 20, 1984 by IEEE Educational Services.

Internet services, Cable television, Continuing education, Videoconferencing, Digital television, Cable Television/Data Services

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The Origins of EE Education: A Matter of Degree

Article Abstract:

A history is given of the development of electrical engineering education in the United States. Cornell and MIT had the first electrical engineering programs, followed by other Ivy League and Midwestern schools. Photographs illustrate important people and places in the history.

Universities and colleges, Education, Electrical engineering, United States, Engineering Education

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