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A model for residual stress in the fabrication of thin glass films

Article Abstract:

An analytical model for determining stresses in thin glass films involves modeling residual stresses, based on the concept of eigenstrains. Such models will find usage in fabricating glass films for semiconductors. Implementation of the model to stress in SiO2 films shows that residual stress depends on the ratio of molar volume of Si to that of SiO2. Viscous flow can reduce the residual stresses, and the extent of stress relief can be determined by the time scale, microkappa. A comparison of analytical predictions of stresses in glass films with experimental data validates the results.

Author: Murray, P.E.
Publisher: American Society of Mechanical Engineers
Publication Name: Journal of Engineering Materials and Technology
Subject: Science and technology
ISSN: 0094-4289
Year: 1996
Research, Analysis, Usage, Residual stresses, Semiconductors, Engineering models, Optical films

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Advanced fabrication and erection techniques for long suspension bridge cables

Article Abstract:

Japanese engineers used a new technique of spinning wire cables in building the Shimotsui Bridge. The technique places wires of correct length in each span without adjusting single wires. Inasmuch as high standards of quality were observed in manufacturing the wires, there are certain points to be cleared. The high straightness of the wires could have been a result of mechanical straightening before being galvanized and the wire material has a high proportional limit. The zinc bath chemistry used in galvanizing should also be clarified.

Author: Birdsall, Blair
Publisher: American Society of Civil Engineers
Publication Name: Journal of Construction Engineering and Management
Subject: Science and technology
ISSN: 0733-9364
Year: 1992
Sheet metal work, Steel wire, Sheet-metal work

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Device fabrication by scanned probe oxidation

Article Abstract:

The invention of the canned probe microscope has enabled the fabrication of nanotechnology devices by manipulating materials at the atomic level as well as viewing atomic-scale structure. The development of the direct oxidation technique is examined.

Author: Dagata, J.A.
Publisher: American Association for the Advancement of Science
Publication Name: Science
Subject: Science and technology
ISSN: 0036-8075
Year: 1995
Innovations, Nanotechnology, Scanning electron microscopes

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Subjects list: Methods
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