Semiconductor International 2000 Peter (Judge) Singer - Abstracts
| Semiconductor International 2000 Peter (Judge) Singer | |||||
| Title | Subject | Authors | |||
|---|---|---|---|---|---|
| 300 mm equipment software requirements defined. | Electronics and electrical industries | Peter (Judge) Singer | |||
| Analyze SiGe with AES and SRP. | Electronics and electrical industries | Peter (Judge) Singer | |||
| BST used to detect hydrogen. | Electronics and electrical industries | Peter (Judge) Singer | |||
| Making sense of the used equipment marketplace. | Electronics and electrical industries | Peter (Judge) Singer | |||
| Metal/High-k transistors formed by damascene process. | Electronics and electrical industries | Peter (Judge) Singer | |||
| Nitride gate dielectric, poly/W electrode enable 100 nm CMOS. | Electronics and electrical industries | Peter (Judge) Singer | |||
| RTO and SiN: an optimum low-cost Si passivation. | Electronics and electrical industries | Peter (Judge) Singer | |||
| Single-wafer processing: soon to be reality? | Electronics and electrical industries | Peter (Judge) Singer | |||
| Small area effect hinders TiSi2 transformation. | Electronics and electrical industries | Peter (Judge) Singer | |||
| Transistors go ballistic at Bell Labs. | Electronics and electrical industries | Peter (Judge) Singer | |||
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